Analysis of Hysteresis Measurements in Epitaxial SRO/PZT/Pt Capacitor Structures

Resultado de la investigación: Contribución a una revistaArtículo


P-E hysteresis loops were measured in SrRuO3/Pb(Zr0.52Ti0.48)O3/Pt capacitor structures grown on (100) SrTiO3 single-crystal substrates using high-oxygen pressure on axis dc-sputtering technique. PZT films were grown by rf magnetron sputtering in a pure oxygen atmosphere. Capacitor structures with electrode areas of 5.0 × 10−4 and 6.5 × 10−3cm2 revealed clear hysteretic behavior. These hysteresis loops displayed asymmetric behavior due to the asymmetry of the electrodes used in SRO/PZT/Pt capacitors. We fitted hysteresis curves measured on capacitors based upon 40-nm thick PZT thin films by using a stochastic model of hysteresis proposed by Pál permitting the extraction of information on their ferroelectric properties.
Idioma originalEspañol (Colombia)
Páginas (desde-hasta)233-240
Número de páginas8
EstadoPublicada - 10 oct 2006

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